Nova Ltd.
Utility Patents

Last updated:

List of all Nova Ltd. patents 17 in total

Status Patent
Grant
Utility: X-ray based measurements in patterned structure External link
Filling date: 6 Sep 2025 Issue date: 24 Aug 2021
Grant
Utility: Metrology and process control for semiconductor manufacturing External link
Filling date: 6 Sep 2025 Issue date: 17 Aug 2021
Grant
Utility: Optical phase measurement method and system External link
Filling date: 6 Sep 2025 Issue date: 8 Jun 2021
Grant
Utility: Method and system for processing patterned structures External link
Filling date: 6 Sep 2025 Issue date: 13 Apr 2021
Grant
Utility: Scatterometry system and method External link
Filling date: 6 Sep 2025 Issue date: 6 Apr 2021
Grant
Utility: TEM-based metrology method and system External link
Filling date: 6 Sep 2025 Issue date: 9 Feb 2021
Grant
Utility: Method and system for optical characterization of patterned samples External link
Filling date: 6 Sep 2025 Issue date: 29 Dec 2020
Grant
Utility: Method and system for optical metrology in patterned structures External link
Filling date: 6 Sep 2025 Issue date: 1 Sep 2020
Grant
Utility: Optical system and method for measurements of samples External link
Filling date: 6 Sep 2025 Issue date: 11 Aug 2020
Grant
Utility: Hybrid metrology method and system External link
Filling date: 6 Sep 2025 Issue date: 4 Aug 2020
Grant
Utility: Optical phase measurement system and method External link
Filling date: 6 Sep 2025 Issue date: 26 May 2020
Grant
Utility: Measuring complex structures in semiconductor fabrication External link
Filling date: 6 Sep 2025 Issue date: 26 May 2020
Grant
Utility: Raman spectroscopy based measurements in patterned structures External link
Filling date: 6 Sep 2025 Issue date: 18 Feb 2020
Grant
Utility: Method for use in process control of manufacture of patterned sample External link
Filling date: 6 Sep 2025 Issue date: 14 Jan 2020
Grant
Utility: Scatterometry system and method External link
Filling date: 6 Sep 2025 Issue date: 6 Aug 2019
Grant
Utility: Optical critical dimension metrology External link
Filling date: 6 Sep 2025 Issue date: 30 Jul 2019
Grant
Utility: Optical phase measurement method and system External link
Filling date: 6 Sep 2025 Issue date: 30 Jul 2019

Showing 1 to 17 of 17 patents.