Camtek Ltd.
Utility Patent Applications

Last updated:

List of all Camtek Ltd. patents 9 in total

Status Patent
Application
Utility: AUTOMATIC DEFECT CLASSIFICATION External link
Filling date: 8 Sep 2025 Issue date: 7 Jul 2022
Application
Utility: METHOD AND SYSTEM FOR CLASSIFYING DEFECTS IN WAFER USING WAFER-DEFECT IMAGES, BASED ON DEEP LEARNING External link
Filling date: 8 Sep 2025 Issue date: 28 Oct 2021
Application
Utility: DEFECT DETECTION External link
Filling date: 8 Sep 2025 Issue date: 1 Oct 2020
Application
Utility: MEASURING BURIED LAYERS External link
Filling date: 8 Sep 2025 Issue date: 3 Sep 2020
Application
Utility: Migdal Haemeq External link
Filling date: 8 Sep 2025 Issue date: 7 May 2020
Application
Utility: HEIGHT MEASUREMENTS OF CONDUCTIVE STRUCTURAL ELEMENTS THAT ARE SURROUNDED BY A PHOTORESIST LAYER External link
Filling date: 8 Sep 2025 Issue date: 21 Nov 2019
Application
Utility: CROSS TALK REDUCTION External link
Filling date: 8 Sep 2025 Issue date: 21 Nov 2019
Application
Utility: OPTICAL CONTRAST ENHANCEMENT FOR DEFECT INSPECTION External link
Filling date: 8 Sep 2025 Issue date: 15 Aug 2019
Application
Utility: INSPECTING AN OBJECT THAT INCLUDES A PHOTO-SENSITIVE POLYIMIDE LAYER External link
Filling date: 8 Sep 2025 Issue date: 8 Aug 2019

Showing 1 to 9 of 9 patents.