KLA
Utility Patents

Last updated:

List of all KLA patents 8 in total

Status Patent
Grant
Utility: Automatic recipe optimization for overlay metrology system External link
Filling date: 6 Sep 2025 Issue date: 24 May 2022
Grant
Utility: Adaptive focusing system for a scanning metrology tool External link
Filling date: 6 Sep 2025 Issue date: 17 May 2022
Grant
Utility: Method and system for manufacturing integrated circuit External link
Filling date: 6 Sep 2025 Issue date: 3 May 2022
Grant
Utility: Full beam metrology for x-ray scatterometry systems External link
Filling date: 6 Sep 2025 Issue date: 26 Apr 2022
Grant
Utility: Process temperature measurement device fabrication techniques and methods of calibration and data interpolation of the same External link
Filling date: 6 Sep 2025 Issue date: 26 Apr 2022
Grant
Utility: Overlay metrology on bonded wafers External link
Filling date: 6 Sep 2025 Issue date: 19 Apr 2022
Grant
Utility: Design-assisted inspection for DRAM and 3D NAND devices External link
Filling date: 6 Sep 2025 Issue date: 19 Apr 2022
Grant
Utility: Delivery of light into a vacuum chamber using an optical fiber External link
Filling date: 6 Sep 2025 Issue date: 12 Apr 2022

Showing 1 to 8 of 8 patents.