KLA
Patents, Design & Utilities

Last updated:

List of all KLA patents 72 in total

Status Patent
Application
Utility: CONTINUOUS DEGENERATE ELLIPTICAL RETARDER FOR SENSITIVE PARTICLE DETECTION External link
Filling date: 6 Sep 2025 Issue date: 25 Aug 2022
Application
Utility: SCANNING SCATTEROMETRY OVERLAY MEASUREMENT External link
Filling date: 6 Sep 2025 Issue date: 7 Jul 2022
Application
Utility: Cantilever-Type Probe with Multiple Metallic Coatings External link
Filling date: 6 Sep 2025 Issue date: 7 Jul 2022
Application
Utility: LASER AND DRUM CONTROL FOR CONTINUOUS GENERATION OF BROADBAND LIGHT External link
Filling date: 6 Sep 2025 Issue date: 30 Jun 2022
Application
Utility: SENSOR CONFIGURATION FOR PROCESS CONDITION MEASURING DEVICES External link
Filling date: 6 Sep 2025 Issue date: 16 Jun 2022
Application
Utility: ON-THE-FLY SCATTEROMETRY OVERLAY METROLOGY TARGET External link
Filling date: 6 Sep 2025 Issue date: 16 Jun 2022
Grant
Utility: Automatic recipe optimization for overlay metrology system External link
Filling date: 6 Sep 2025 Issue date: 24 May 2022
Grant
Utility: Adaptive focusing system for a scanning metrology tool External link
Filling date: 6 Sep 2025 Issue date: 17 May 2022
Application
Utility: STRONTIUM TETRABORATE AS OPTICAL GLASS MATERIAL External link
Filling date: 6 Sep 2025 Issue date: 5 May 2022
Application
Utility: REFLECTIVE COMPACT LENS FOR MAGNETO-OPTIC KERR EFFECT METROLOGY SYSTEM External link
Filling date: 6 Sep 2025 Issue date: 5 May 2022
Application
Utility: METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND PROCESS CONTROL SYSTEM FOR A SEMICONDUCTOR MANUFACTURING ASSEMBLY External link
Filling date: 6 Sep 2025 Issue date: 5 May 2022
Grant
Utility: Method and system for manufacturing integrated circuit External link
Filling date: 6 Sep 2025 Issue date: 3 May 2022
Application
Utility: PREDICTION AND METROLOGY OF STOCHASTIC PHOTORESIST THICKNESS DEFECTS External link
Filling date: 6 Sep 2025 Issue date: 28 Apr 2022
Application
Utility: High Flow Vacuum Chuck External link
Filling date: 6 Sep 2025 Issue date: 28 Apr 2022
Grant
Utility: Full beam metrology for x-ray scatterometry systems External link
Filling date: 6 Sep 2025 Issue date: 26 Apr 2022
Grant
Utility: Process temperature measurement device fabrication techniques and methods of calibration and data interpolation of the same External link
Filling date: 6 Sep 2025 Issue date: 26 Apr 2022
Grant
Utility: Overlay metrology on bonded wafers External link
Filling date: 6 Sep 2025 Issue date: 19 Apr 2022
Grant
Utility: Design-assisted inspection for DRAM and 3D NAND devices External link
Filling date: 6 Sep 2025 Issue date: 19 Apr 2022
Application
Utility: Dynamic Control Of Machine Learning Based Measurement Recipe Optimization External link
Filling date: 6 Sep 2025 Issue date: 14 Apr 2022
Grant
Utility: Delivery of light into a vacuum chamber using an optical fiber External link
Filling date: 6 Sep 2025 Issue date: 12 Apr 2022
Application
Utility: Frequency Conversion Using Stacked Strontium Tetraborate Plates External link
Filling date: 6 Sep 2025 Issue date: 7 Apr 2022
Application
Utility: SYSTEM AMD METHOD FOR DETERMINING TARGET FEATURE FOCUS IN IMAGE-BASED OVERLAY METROLOGY External link
Filling date: 6 Sep 2025 Issue date: 7 Apr 2022
Application
Utility: APPARATUS, METHOD AND COMPUTER PROGRAM PRODUCT FOR DEFECT DETECTION IN WORK PIECES External link
Filling date: 6 Sep 2025 Issue date: 31 Mar 2022
Application
Utility: INTERPRETABLE DEEP LEARNING-BASED DEFECT DETECTION AND CLASSIFICATION External link
Filling date: 6 Sep 2025 Issue date: 31 Mar 2022
Application
Utility: Large-Particle Monitoring with Laser Power Control for Defect Inspection External link
Filling date: 6 Sep 2025 Issue date: 24 Mar 2022
Application
Utility: SYSTEM AND METHOD FOR ACCELERATING PHYSICAL SIMULATION MODELS DURING MICROELECTRONIC DEVICE FABRICATION External link
Filling date: 6 Sep 2025 Issue date: 10 Mar 2022
Application
Utility: Wafer Level Spatial Signature Grouping Using Transfer Learning External link
Filling date: 6 Sep 2025 Issue date: 3 Mar 2022
Application
Utility: PROTECTION OF OPTICAL MATERIALS OF OPTICAL COMPONENTS FROM RADIATION DEGRADATION External link
Filling date: 6 Sep 2025 Issue date: 3 Mar 2022
Application
Utility: Unsupervised Learning for Repeater-Defect Detection External link
Filling date: 6 Sep 2025 Issue date: 24 Feb 2022
Application
Utility: FLUORINE-DOPED OPTICAL MATERIALS FOR OPTICAL COMPONENTS External link
Filling date: 6 Sep 2025 Issue date: 17 Feb 2022
Application
Utility: 3D STRUCTURE INSPECTION OR METROLOGY USING DEEP LEARNING External link
Filling date: 6 Sep 2025 Issue date: 10 Feb 2022
Application
Utility: DEEP LEARNING BASED DEFECT DETECTION External link
Filling date: 6 Sep 2025 Issue date: 10 Feb 2022
Application
Utility: DEEP GENERATIVE MODELS FOR OPTICAL OR OTHER MODE SELECTION External link
Filling date: 6 Sep 2025 Issue date: 3 Feb 2022
Application
Utility: GREY-MODE SCANNING SCATTEROMETRY OVERLAY METROLOGY External link
Filling date: 6 Sep 2025 Issue date: 3 Feb 2022
Application
Utility: Adaptive Focusing System for a Scanning Metrology Tool External link
Filling date: 6 Sep 2025 Issue date: 3 Feb 2022
Application
Utility: Inspection of Noisy Patterned Features External link
Filling date: 6 Sep 2025 Issue date: 3 Feb 2022
Application
Utility: INTER-STEP FEEDFORWARD PROCESS CONTROL IN THE MANUFACTURE OF SEMICONDUCTOR DEVICES External link
Filling date: 6 Sep 2025 Issue date: 27 Jan 2022
Application
Utility: Wavelet System and Method for Ameliorating Misregistration and Asymmetry of Semiconductor Devices External link
Filling date: 6 Sep 2025 Issue date: 20 Jan 2022
Application
Utility: Misregistration Target Having Device-Scaled Features Useful in Measuring Misregistration of Semiconductor Devices External link
Filling date: 6 Sep 2025 Issue date: 13 Jan 2022
Application
Utility: SYSTEMS AND METHODS FOR FEEDFORWARD PROCESS CONTROL IN THE MANUFACTURE OF SEMICONDUCTOR DEVICES External link
Filling date: 6 Sep 2025 Issue date: 6 Jan 2022
Application
Utility: Soft X-Ray Optics With Improved Filtering External link
Filling date: 6 Sep 2025 Issue date: 30 Dec 2021
Application
Utility: DESIGN-TO-WAFER IMAGE CORRELATION BY COMBINING INFORMATION FROM MULTIPLE COLLECTION CHANNELS External link
Filling date: 6 Sep 2025 Issue date: 23 Dec 2021
Application
Utility: Localized Purge Module for Substrate Handling External link
Filling date: 6 Sep 2025 Issue date: 16 Dec 2021
Application
Utility: IMAGE ALIGNMENT SETUP FOR SPECIMENS WITH INTRA- AND INTER-SPECIMEN VARIATIONS USING UNSUPERVISED LEARNING AND ADAPTIVE DATABASE GENERATION METHODS External link
Filling date: 6 Sep 2025 Issue date: 9 Dec 2021
Application
Utility: Non-Orthogonal Target and Method for Using the Same in Measuring Misregistration of Semiconductor Devices External link
Filling date: 6 Sep 2025 Issue date: 25 Nov 2021
Application
Utility: Substrate with Cut Semiconductor Pieces Having Measurement Test Structures for Semiconductor Metrology External link
Filling date: 6 Sep 2025 Issue date: 11 Nov 2021
Application
Utility: METROLOGY TARGET FOR SCANNING METROLOGY External link
Filling date: 6 Sep 2025 Issue date: 7 Oct 2021
Application
Utility: Self-Aligning Vacuum Feed-Through for Liquid Nitrogen External link
Filling date: 6 Sep 2025 Issue date: 7 Oct 2021
Application
Utility: ONLINE NAVIGATIONAL DRIFT CORRECTION FOR METROLOGY MEASUREMENTS External link
Filling date: 6 Sep 2025 Issue date: 7 Oct 2021
Application
Utility: Soft X-Ray Optics With Improved Filtering External link
Filling date: 6 Sep 2025 Issue date: 7 Oct 2021

Showing 1 to 50 of 72 patents.