Onto Innovation
Patents, Design & Utilities

Last updated:

List of all Onto Innovation patents 39 in total

Status Patent
Application
Utility: NON-DESTRUCTIVE INSPECTION AND MANUFACTURING METROLOGY SYSTEMS AND METHODS External link
Filling date: 5 Sep 2025 Issue date: 21 Jul 2022
Grant
Utility: Interferometry with pixelated color discriminating elements combined with pixelated polarization masks External link
Filling date: 5 Sep 2025 Issue date: 7 Jun 2022
Grant
Utility: Conformal stage External link
Filling date: 5 Sep 2025 Issue date: 7 Jun 2022
Application
Utility: FOCUS SYSTEM FOR OBLIQUE OPTICAL METROLOGY DEVICE External link
Filling date: 5 Sep 2025 Issue date: 2 Jun 2022
Application
Utility: VORTEX POLARIMETER External link
Filling date: 5 Sep 2025 Issue date: 2 Jun 2022
Grant
Utility: Focus system for oblique optical metrology device External link
Filling date: 5 Sep 2025 Issue date: 31 May 2022
Grant
Utility: Vortex polarimeter External link
Filling date: 5 Sep 2025 Issue date: 31 May 2022
Grant
Utility: Fast generalized multi-wavelength ellipsometer External link
Filling date: 5 Sep 2025 Issue date: 31 May 2022
Grant
Utility: Active damper for semiconductor metrology and inspection systems External link
Filling date: 5 Sep 2025 Issue date: 22 Mar 2022
Application
Utility: SYSTEM AND METHOD FOR OPTIMIZING A LITHOGRAPHY EXPOSURE PROCESS External link
Filling date: 5 Sep 2025 Issue date: 10 Mar 2022
Grant
Utility: On-axis dynamic interferometer and optical imaging systems employing the same External link
Filling date: 5 Sep 2025 Issue date: 1 Mar 2022
Grant
Utility: Optical metrology device using numerical aperture reduction External link
Filling date: 5 Sep 2025 Issue date: 2 Nov 2021
Application
Utility: TARGET FOR OPTICAL MEASUREMENT OF TRENCHES External link
Filling date: 5 Sep 2025 Issue date: 21 Oct 2021
Grant
Utility: Sample surface polarization modification in interferometric defect inspection External link
Filling date: 5 Sep 2025 Issue date: 19 Oct 2021
Application
Utility: CHARACTERIZATION OF PATTERNED STRUCTURES USING ACOUSTIC METROLOGY External link
Filling date: 5 Sep 2025 Issue date: 14 Oct 2021
Application
Utility: ENHANCED HEAT TRANSFER IN LIQUEFIED GAS COOLED DETECTOR External link
Filling date: 5 Sep 2025 Issue date: 7 Oct 2021
Grant
Utility: System and method for optimizing a lithography exposure process External link
Filling date: 5 Sep 2025 Issue date: 21 Sep 2021
Application
Utility: SYSTEM AND METHOD FOR CORRECTING OVERLAY ERRORS IN A LITHOGRAPHIC PROCESS External link
Filling date: 5 Sep 2025 Issue date: 26 Aug 2021
Application
Utility: FAST GENERALIZED MULTI-WAVELENGTH ELLIPSOMETER External link
Filling date: 5 Sep 2025 Issue date: 26 Aug 2021
Grant
Utility: Calibration of azimuth angle for optical metrology stage using grating-coupled surface plasmon resonance External link
Filling date: 5 Sep 2025 Issue date: 3 Aug 2021
Application
Utility: BEAMSPLITTER BASED ELLIPSOMETER FOCUSING SYSTEM External link
Filling date: 5 Sep 2025 Issue date: 1 Apr 2021
Application
Utility: SAMPLE SURFACE POLARIZATION MODIFICATION IN INTERFEROMETRIC DEFECT INSPECTION External link
Filling date: 5 Sep 2025 Issue date: 25 Mar 2021
Grant
Utility: Sample inspection using topography External link
Filling date: 5 Sep 2025 Issue date: 2 Mar 2021
Grant
Utility: Sub-resolution defect detection External link
Filling date: 5 Sep 2025 Issue date: 2 Mar 2021
Grant
Utility: Non-adhesive mounting assembly for a tall Rochon polarizer External link
Filling date: 5 Sep 2025 Issue date: 9 Feb 2021
Grant
Utility: Optical metrology system using infrared wavelengths External link
Filling date: 5 Sep 2025 Issue date: 26 Jan 2021
Application
Utility: CONFORMAL STAGE External link
Filling date: 5 Sep 2025 Issue date: 24 Dec 2020
Application
Utility: ACTIVE DAMPER FOR SEMICONDUCTOR METROLOGY AND INSPECTION SYSTEMS External link
Filling date: 5 Sep 2025 Issue date: 26 Nov 2020
Application
Utility: OPTICAL METROLOGY DEVICE USING NUMERICAL APERTURE REDUCTION External link
Filling date: 5 Sep 2025 Issue date: 19 Nov 2020
Application
Utility: LASER TRIANGULATION SENSOR SYSTEM AND METHOD FOR WAFER INSPECTION External link
Filling date: 5 Sep 2025 Issue date: 12 Nov 2020
Grant
Utility: Interferometer with pixelated phase shift mask External link
Filling date: 5 Sep 2025 Issue date: 10 Nov 2020
Application
Utility: SEPARATED AXIS LITHOGRAPHIC TOOL External link
Filling date: 5 Sep 2025 Issue date: 22 Oct 2020
Grant
Utility: FOUP purge shield External link
Filling date: 5 Sep 2025 Issue date: 22 Sep 2020
Grant
Utility: Light source failure identification in an optical metrology device External link
Filling date: 5 Sep 2025 Issue date: 15 Sep 2020
Application
Utility: HIGH RESOLUTION STAGE POSITIONER External link
Filling date: 5 Sep 2025 Issue date: 10 Sep 2020
Grant
Utility: Optical metrology device for measuring samples having thin or thick films External link
Filling date: 5 Sep 2025 Issue date: 18 Aug 2020
Application
Utility: SYSTEM AND METHOD FOR OPTIMIZING A LITHOGRAPHY EXPOSURE PROCESS External link
Filling date: 5 Sep 2025 Issue date: 23 Jul 2020
Application
Utility: OPTICAL METROLOGY DEVICE FOR MEASURING SAMPLES HAVING THIN OR THICK FILMS External link
Filling date: 5 Sep 2025 Issue date: 11 Jun 2020
Grant
Utility: Correction of angular error of plane-of-incidence azimuth of optical metrology device External link
Filling date: 5 Sep 2025 Issue date: 14 Apr 2020

Showing 1 to 39 of 39 patents.