KLA
Patents, Design & Utilities

Last updated:

List of all KLA patents 357 in total

Status Patent
Grant
Utility: Laser sustained plasma light source with high pressure flow External link
Filling date: 6 Sep 2025 Issue date: 20 Sep 2022
Grant
Utility: BBP assisted defect detection flow for SEM images External link
Filling date: 6 Sep 2025 Issue date: 20 Sep 2022
Grant
Utility: Thin pellicle material for protection of solid-state electron detectors External link
Filling date: 6 Sep 2025 Issue date: 13 Sep 2022
Grant
Utility: Broadband light interferometry for focal-map generation in photomask inspection External link
Filling date: 6 Sep 2025 Issue date: 13 Sep 2022
Application
Utility: MULTI-FIELD SCANNING OVERLAY METROLOGY External link
Filling date: 6 Sep 2025 Issue date: 8 Sep 2022
Application
Utility: Secure Remote Collaboration for Equipment in a Manufacturing Facility External link
Filling date: 6 Sep 2025 Issue date: 1 Sep 2022
Grant
Utility: Method of manufacturing a semiconductor device and process control system for a semiconductor manufacturing assembly External link
Filling date: 6 Sep 2025 Issue date: 30 Aug 2022
Grant
Utility: Scanning scatterometry overlay measurement External link
Filling date: 6 Sep 2025 Issue date: 30 Aug 2022
Grant
Utility: System and method for inspection using tensor decomposition and singular value decomposition External link
Filling date: 6 Sep 2025 Issue date: 30 Aug 2022
Grant
Utility: Computationally efficient x-ray based overlay measurement External link
Filling date: 6 Sep 2025 Issue date: 30 Aug 2022
Grant
Utility: Soft gripper with multizone control to allow individual joint articulation External link
Filling date: 6 Sep 2025 Issue date: 30 Aug 2022
Application
Utility: Full Beam Metrology For X-Ray Scatterometry Systems External link
Filling date: 6 Sep 2025 Issue date: 25 Aug 2022
Application
Utility: METHODS FOR IMPROVING OPTICAL INSPECTION AND METROLOGY IMAGE QUALITY USING CHIP DESIGN DATA External link
Filling date: 6 Sep 2025 Issue date: 25 Aug 2022
Application
Utility: VERTICAL CONVOLUTE METAL BELLOWS FOR ROTARY MOTION, VACUUM SEALING, AND PRESSURE SEALING External link
Filling date: 6 Sep 2025 Issue date: 25 Aug 2022
Grant
Utility: Broadband ultraviolet illumination sources External link
Filling date: 6 Sep 2025 Issue date: 23 Aug 2022
Application
Utility: Dual Vacuum Seal External link
Filling date: 6 Sep 2025 Issue date: 18 Aug 2022
Application
Utility: SYSTEMS AND METHODS FOR EVALUATING THE RELIABILITY OF SEMICONDUCTOR DIE PACKAGES External link
Filling date: 6 Sep 2025 Issue date: 18 Aug 2022
Application
Utility: Method and Apparatus for EUV Mask Inspection External link
Filling date: 6 Sep 2025 Issue date: 18 Aug 2022
Grant
Utility: System, method and apparatus for polarization control External link
Filling date: 6 Sep 2025 Issue date: 16 Aug 2022
Grant
Utility: Laser produced plasma light source having a target material coated on a cylindrically-symmetric element External link
Filling date: 6 Sep 2025 Issue date: 16 Aug 2022
Grant
Utility: Multi-controller inspection system External link
Filling date: 6 Sep 2025 Issue date: 16 Aug 2022
Grant
Utility: Controlling a process for inspection of a specimen External link
Filling date: 6 Sep 2025 Issue date: 16 Aug 2022
Grant
Utility: Light modulated electron source External link
Filling date: 6 Sep 2025 Issue date: 16 Aug 2022
Grant
Utility: Statistical learning-based mode selection for multi-mode inspection External link
Filling date: 6 Sep 2025 Issue date: 16 Aug 2022
Grant
Utility: Signal-domain adaptation for metrology External link
Filling date: 6 Sep 2025 Issue date: 16 Aug 2022
Application
Utility: Methods And Systems For Accurate Measurement Of Deep Structures Having Distorted Geometry External link
Filling date: 6 Sep 2025 Issue date: 11 Aug 2022
Application
Utility: THREE-DIMENSIONAL IMAGING WITH ENHANCED RESOLUTION External link
Filling date: 6 Sep 2025 Issue date: 11 Aug 2022
Application
Utility: BACK-ILLUMINATED SENSOR WITH BORON LAYER DEPOSITED USING PLASMA ATOMIC LAYER DEPOSITION External link
Filling date: 6 Sep 2025 Issue date: 11 Aug 2022
Application
Utility: HIGH RESOLUTION ELECTRON BEAM APPARATUS WITH DUAL-APERTURE SCHEMES External link
Filling date: 6 Sep 2025 Issue date: 11 Aug 2022
Grant
Utility: Equi-probability defect detection External link
Filling date: 6 Sep 2025 Issue date: 9 Aug 2022
Grant
Utility: System and method for generation of wafer inspection critical areas External link
Filling date: 6 Sep 2025 Issue date: 9 Aug 2022
Grant
Utility: Non-orthogonal target and method for using the same in measuring misregistration of semiconductor devices External link
Filling date: 6 Sep 2025 Issue date: 9 Aug 2022
Grant
Utility: Machine learning for metrology measurements External link
Filling date: 6 Sep 2025 Issue date: 9 Aug 2022
Application
Utility: DESIGN-ASSISTED INSPECTION FOR DRAM AND 3D NAND DEVICES External link
Filling date: 6 Sep 2025 Issue date: 4 Aug 2022
Application
Utility: CORRECTING ABERRATION AND APODIZATION OF AN OPTICAL SYSTEM USING CORRECTION PLATES External link
Filling date: 6 Sep 2025 Issue date: 4 Aug 2022
Application
Utility: SENSITIVITY IMPROVEMENT OF OPTICAL AND SEM DEFECTION INSPECTION External link
Filling date: 6 Sep 2025 Issue date: 4 Aug 2022
Application
Utility: MEASUREMENT OF PROPERTIES OF PATTERNED PHOTORESIST External link
Filling date: 6 Sep 2025 Issue date: 28 Jul 2022
Grant
Utility: Apparatus and method for gray field imaging External link
Filling date: 6 Sep 2025 Issue date: 26 Jul 2022
Application
Utility: METHOD AND SYSTEM FOR MIXED MODE WAFER INSPECTION External link
Filling date: 6 Sep 2025 Issue date: 21 Jul 2022
Grant
Utility: Metrics for asymmetric wafer shape characterization External link
Filling date: 6 Sep 2025 Issue date: 19 Jul 2022
Application
Utility: PROCESS CONDITION SENSING APPARATUS External link
Filling date: 6 Sep 2025 Issue date: 14 Jul 2022
Grant
Utility: Method of fabricating particle size standards on substrates External link
Filling date: 6 Sep 2025 Issue date: 12 Jul 2022
Application
Utility: SYSTEM AND METHOD FOR FOCUS CONTROL IN EXTREME ULTRAVIOLET LITHOGRAPHY SYSTEMS USING A FOCUS-SENSITIVE METROLOGY TARGET External link
Filling date: 6 Sep 2025 Issue date: 7 Jul 2022
Grant
Utility: On-the-fly scatterometry overlay metrology target External link
Filling date: 6 Sep 2025 Issue date: 5 Jul 2022
Grant
Utility: Method for process monitoring with optical inspections External link
Filling date: 6 Sep 2025 Issue date: 5 Jul 2022
Grant
Utility: Methods and systems for inspection of semiconductor structures with automatically generated defect features External link
Filling date: 6 Sep 2025 Issue date: 5 Jul 2022
Application
Utility: METHOD AND SYSTEM FOR MANUFACTURING INTEGRATED CIRCUIT External link
Filling date: 6 Sep 2025 Issue date: 30 Jun 2022
Grant
Utility: Laser closed power loop with an acousto-optic modulator for power modulation External link
Filling date: 6 Sep 2025 Issue date: 28 Jun 2022
Application
Utility: MULTI-BEAM ELECTRONICS SCAN External link
Filling date: 6 Sep 2025 Issue date: 23 Jun 2022
Application
Utility: Methods And Systems For Compact, Small Spot Size Soft X-Ray Scatterometry External link
Filling date: 6 Sep 2025 Issue date: 23 Jun 2022

Showing 1 to 50 of 357 patents.